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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

Name: Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry
Price: 282.81 MAD
Availability: InStock

Product ID: 287271514

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Pore Characterization in Low-k Dielectric Films Using X-Ray Reflectivity: X-Ray Porosimetry

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TrustScore 4.5 | 7,300+ reviews

Anjali K.

The product quality is outstanding. Exactly what I needed for my work.

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The MOLLE sheath is of exceptional quality. Very happy with my purchase.

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282 DH

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Trustpilot

TrustScore 4.5 | 7,300+ reviews

Rajesh P.

Customer service was outstanding when I had questions about the product.

2 days ago

Zainab N.

Fantastic and great service. Shipping was faster than expected.

1 week ago

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